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Quality Control of OLED Substrates - Next Generation of Large Area Inspection!

During the production of epitaxial layers for OLED devices, a variety of different defects can occur due to imperfect substrate quality, process-related contaminations and the coating process. Various sophisticated #inspection methods are available for their safe and reliable detection.

The detection of exposure and implantation defects as well as the control of overlay offset and CD values are crucial for the complex manufacturing of non-standard or oversized optoelectronic products.

Intego's customized multi-camera inspection and measurement systems are supported by the proprietary CAD-based defect detection and wafer yield prediction software. In addition to traditional evaluation algorithms, advanced neural networks are available for defect detection and classification. #semiconductor #electronics #led #microscopy #metrology #surfaceinspection #qualitycontrol


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