SOLAR INSPECTION SYSTEMS
From silicon to solar modules: Intego offers inspection systems for all production steps
SAPPHIRE INSPECTION SYSTEMS
Inclusions, crystal defects, geometry measurement: Quality control in sapphire products is crucial for faultless products
PLASTICS INSPECTION SYSTEMS
Automotive or medical engineering: Intego has many years of experience in inspection technologies for plastic products
METAL INSPECTION SYSTEMS
Surface inspection or measurement of grooves: Convince yourself of our solutions
SEMICONDUCTORS INSPECTION SYSTEMS
Short inspection times and microscope techniques enable a 100% production control More...
ELECTRONIC INSPECTION SYSTEMS
Lock-in thermography shows defects and material properties below the visible surface
The combination of complex camera technology and automation allows new solutions in industrial production
Intego is an innovative medium-sized company located in Erlangen, Germany. Together with our team we develop and manufacture complex inspection systems for our customers worldwide.
Our systems combine automation, image acquisition and data analysis. We offer inspection systems for the production of circuit boards, tracks as well as printed and flexible electronics (displays).
Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
The installation of high performance microelectronics in high temperature environments requires the use of ceramic circuit boards. The mechanical integrity of the manufactured and component loaded ceramic substrates is an important criterion. The Intego system for ceramics offers new solutions for the vision inspection in your production line.
Intego is a specialist in high resolution inspection of small structures on electronics (components, lithography, SMDs). The possible inspection objectives as well as the available measuring units are determined by the capabilities of the microscope scanner.
• Electronic devices• Microscope resolution
• Microcracks, inclusions• Measurements