New Product: Grain Analysis

For a wafer dependent process management and a
statistical process optimization in the manufacturing
of solar wafers and cells it is reasonable to analyse
the grain structure of multicrystalline and mono-like
wafers.

The GEMINI grain analysis system is able to extract
from the natural grain structure of wafers several
data, e.g.:

• Number of grains and size of each grain
• Overall length of grain boundaries
• Recognition of twin grains
• Percentage of area of largest grain

The system is available as a stand alone machine for
measurements of wafers in a laboratory environment
and also as inline tool e.g. for quick mono-like
characterization.

The GEMINI grain analysis system acquires multiple
images of one wafer. This is necessary to get reliable
results of the grain structure on the wafer. Only in
using different illuminations for one wafer it is possible
to make every single grain visible.

Data Sheet GEMINI Grain Analysis