Home
  • Sitemap
  • Imprint
  • English
  • Deutsch
  • Intego
  • Solar
  • Plastics
  • Metal
  • Semiconductor
  • Download
  • Contact
Previous Button
Next Button

Gemini Quality Tracking

GEMINI is an identification and tracking system for multi-crystalline ingots, wafers and cells. It is camera-based and uses the natural grain structures in the poly-Si material for calculation of several different characteristic measures. These characteristic measures together give a finger print, the WafID which is

  • unique,
  • non-marking and
  • non-contacting,

allowing identification and tracking from raw wafers to finished cells.

The main areas of application of GEMINI are

  • Block reconstruction
    Reconstruct wafer position in the original ingot (accuracy approx ± 5 mm)
  • Wafer and Cell tracking
    Track wafers from the raw wafer to the end of the module fabrication line
  • Claim handling
    Verify that wafers have been produced in a specific factory

Advantages and customer’s benefits

  • Non-marking
  • Wafer position in ingot and crystal analysisavailable
  • Very competitive costs (no additional cameras, PCs, setups)
  • No additional space
  • High recognition rate (>98%)

Data Sheet GEMINI Block Reconstruction

Data Sheet GEMINI Tracking

Data Sheet GEMINI Stand-alone System

For a larger view please
click on the thumbnails.

GEMINI - Quality Tracking
GEMINI - Quality Tracking
GEMINI - Quality Tracking
GUI block reconstruction
GUI block reconstruction
GUI block reconstruction
Grain structure on wafer
Grain structure on wafer
Grain structure on wafer
Grain structure on cell
Grain structure on cell
Grain structure on cell

Solar

  • Vision Systems Solar
  • Ingots
  • Wafer
    • Antares
    • Gemini
    • Grain Analysis
    • Taurus
  • Cells
  • Modules