SOLAR INSPECTION SYSTEMS
From silicon to solar modules: Intego offers inspection systems for all production steps
SAPPHIRE INSPECTION SYSTEMS
Inclusions, crystal defects, geometry measurement: Quality control in sapphire products is crucial for faultless products
PLASTICS INSPECTION SYSTEMS
Automotive or medical engineering: Intego has many years of experience in inspection technologies for plastic products
METAL INSPECTION SYSTEMS
Surface inspection or measurement of grooves: Convince yourself of our solutions
SEMICONDUCTORS INSPECTION SYSTEMS
Short inspection times and microscope techniques enable a 100% production control More...
ELECTRONIC INSPECTION SYSTEMS
Lock-in thermography shows defects and material properties below the visible surface
The combination of complex camera technology and automation allows new solutions in industrial production
Intego is an innovative medium-sized company located in Erlangen, Germany. Together with our team we develop and manufacture complex inspection systems for our customers worldwide.
Intego develops and produces customer-specific inspection systems. We apply the latest measurement and imaging technologies to perform complex inspection tasks reliably.
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silicon, ingots, wafer, cells, solar modules
crystallographic defects, 3D geometry
automotive, medical devices, displays
surfaces, detection of grooves
microscope techniques, photoluminescence
Because of our many years of experience with automation processes and close cooperations with our customers, even the most complex systems can be optimally integrated into existing production lines.
We apply the latest measurement and imaging technologies to perform complex inspection tasks reliably. If you are looking for an individual solution, we offer free-of-charge preliminary studies based on your sample parts.
The prepared report consists of technical details addressing feasibility and includes a system design draft with specifications in addition to a price estimate.
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Intego was awarded the 2016 Semikron Innovation Award for the development of an inspection system for material defects on SiC wafers. The system was developed by Intego, together with the Fraunhofer IISB, the University of Erlangen-Nürnberg and Infineon.
14.-17.11.2017: Hall B1/Booth 1894Semicon Europa in Munich
We are a medium-sized technology company in Erlangen with:
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